RF measurements of die and packages [electronic resource] / Scott A. Wartenberg.

Saved in:

Bibliographic Details
Online Access:	Full Text (via IEEE)
Main Author:	Wartenberg, Scott A.
Format:	Electronic eBook
Language:	English
Published:	Boston : Artech House, ©2002.
Series:	Artech House microwave library.
Subjects:	Very high speed integrated circuits > Measurements. Integrated circuits > Masks > Design and construction. Microelectronic packaging. Radio measurements.

Internet

Full Text (via IEEE)

Holdings details from Online
Call Number:	TK7874.7
TK7874.7	Available