Measuring economic downside risk and severity [electronic resource] : growth at risk / Yan Wang and Yudong Yao.

Using growth at risk as a measure of downside growth risk, the authors find that higher perceived levels of downside growth risk seem to be negatively associated with long-term growth.

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Bibliographic Details
Online Access: Full Text (via Open Knowledge Repository)
Main Author: Wang, Yan, 1953-
Corporate Author: World Bank Institute. Economic Policy and Poverty Reduction
Other Authors: Yao, Yudong
Format: Electronic eBook
Language:English
Published: Washington, D.C. : World Bank, World Bank Institute, Economic Policy and Poverty Reduction Division, [2001]
Series:Policy research working papers ; 2674.
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Call Number: HG3881.5.W57 P63 no.2674
HG3881.5.W57 P63 no.2674 Available