Advanced Production Testing of RF, SoC, and SiP Devices.
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that ar...
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| Online Access: |
Full Text (via ProQuest) |
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| Main Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
Norwood :
Artech House,
2006.
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| Series: | Artech House microwave library.
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Internet
Full Text (via ProQuest)Online
| Call Number: |
TK7895.E42
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|---|---|
| TK7895.E42 | Available |