VLSI test principles and architectures : design for testability /

VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

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Bibliographic Details
Online Access: Full Text (via ProQuest)
Other Authors: Wang, Laung-Terng (Editor), Wu, Cheng-Wen, EE Ph. D. (Editor), Wen, Xiaoqing (Editor)
Format: eBook
Language:English
Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, ©2006.
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Integrated circuits > Very large scale integration > Design and construction.

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Full Text (via ProQuest)

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Call Number: TK7874.75 .V587 2006eb
TK7874.75 .V587 2006eb Available

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