X-Ray Nanoimaging : Instruments and Methods II : 12-13 August 2015, San Diego, California, United States / Barry Lai, editor ; sponsored and published by SPIE.

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Bibliographic Details
Online Access: Full Text (via SPIE Digital Library)
Corporate Author: SPIE (Society) (sponsoring body.)
Other Authors: Lai, Barry (Editor)
Format: eBook
Language:English
Published: Bellingham, Washington : SPIE, [2015]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 9592.
Subjects:

MARC

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