X-Ray Nanoimaging : Instruments and Methods II : 12-13 August 2015, San Diego, California, United States / Barry Lai, editor ; sponsored and published by SPIE.

Saved in:

Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Author:	SPIE (Society) (sponsoring body.)
Other Authors:	Lai, Barry (Editor)
Format:	eBook
Language:	English
Published:	Bellingham, Washington : SPIE, [2015]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 9592.
Subjects:	Nanotechnology > Instruments > Congresses. X-ray microscopy > Instruments > Congresses. X-ray optics > Instruments > Congresses. Imaging systems > Instruments > Congresses.

Internet

Holdings details from Online
Call Number:	QH212.X2 X35 2015e
QH212.X2 X35 2015e	Available