X-Ray Nanoimaging : Instruments and Methods II : 12-13 August 2015, San Diego, California, United States / Barry Lai, editor ; sponsored and published by SPIE.
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Format: | eBook |
Language: | English |
Published: |
Bellingham, Washington :
SPIE,
[2015]
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Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 9592. |
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Internet
Full Text (via SPIE Digital Library)Online
Call Number: |
QH212.X2 X35 2015e
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QH212.X2 X35 2015e | Available |