Scanning Microscopies 2015 : 29 September-1 October 2015, Monterey, California, United States / Michael T. Postek, Dale E. Newbury, S. Frank Platek, Tim K. Maugel, editors ; sponsored and published by SPIE.

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceeding...

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Online Access: Full Text (via SPIE Digital Library)
Corporate Author: SPIE (Society) (sponsoring body.)
Other Authors: Postek, Michael T. (Editor), Newbury, Dale E. (Editor), Platek, S. Frank (Editor), Maugel, Tim K. (Editor)
Format: eBook
Language:English
Published: Bellingham, Washington : SPIE, [2015]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 9636.
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Call Number: QH212.S3 S346 2015e
QH212.S3 S346 2015e Available