Bibliographic Details
| Online Access: |
Full Text (via SPIE Digital Library)
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| Corporate Authors: |
International Symposium on Laser Metrology Singapore,
Nanyang Technological University. School of Mechanical and Aerospace Engineering,
National University of Singapore. Department of Mechanical Engineering,
Singapore. Agency for Science, Technology and Research,
Singapore Institue of Manufacturing Technology,
SPIE Digital Library,
SPIE (Society) |
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| Other Authors: |
Quan, Chenggen,
Asundi, Anand |
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| Format: | Electronic
Conference Proceeding
eBook
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| Language: | English |
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| Published: |
Bellingham, Wash. :
SPIE,
©2008.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 7155.
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| Subjects: | |
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