Achromatization of Debye-Scherrer lines / Hans Ekstein and Stanley Siegel.
A method is presented for reducing the width of a Debye-Scherrer line produced by diffraction from a polycrystalline medium when the width is due to spectral impurity of the primary characteristic radiation. By this method, different wave lengths diffracted by the sample can be brought to a narrow f...
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| Other title: | Technical report archive and image library. |
| Format: | Government Document Book |
| Language: | English |
| Published: |
Washington, D.C. :
National Advisory Committee for Aeronautics,
1951.
|
| Series: | Technical note (United States. National Advisory Committee for Aeronautics) ;
2355. |
| Subjects: |
MARC
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| 100 | 1 | |a Ekstein, Hans. | |
| 245 | 1 | 0 | |a Achromatization of Debye-Scherrer lines / |c Hans Ekstein and Stanley Siegel. |
| 260 | |a Washington, D.C. : |b National Advisory Committee for Aeronautics, |c 1951. | ||
| 300 | |a 23 pages : |b illustrations ; |c 28 cm. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a unmediated |b n |2 rdamedia. | ||
| 338 | |a volume |b nc |2 rdacarrier. | ||
| 490 | 1 | |a National Advisory Committee for Aeronautics. Technical Note ; |v no. 2355. | |
| 500 | |a "April 1951." | ||
| 500 | |a NACA TN Number 2355. | ||
| 504 | |a Includes bibliographical references. | ||
| 520 | 3 | |a A method is presented for reducing the width of a Debye-Scherrer line produced by diffraction from a polycrystalline medium when the width is due to spectral impurity of the primary characteristic radiation. By this method, different wave lengths diffracted by the sample can be brought to a narrow focus. | |
| 520 | 3 | |a Practically, an increase of resolution of the order of 10 can be expected using this method as compared with the ideal optimum resolution obtained by using the conventional method. | |
| 583 | 1 | |a will digitize |c 20150604 |z Queued for digitization June 4, 2015 |2 pda |5 miu. | |
| 650 | 0 | |a X-rays |x Diffraction. |0 http://id.loc.gov/authorities/subjects/sh85148750. | |
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| 700 | 1 | |a Siegel, Stanley. |0 http://id.loc.gov/authorities/names/n50024014 |1 http://isni.org/isni/0000000084619791. | |
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| 776 | 0 | 8 | |i Online version: |a Ekstein, Hans. |t Achromatization of Debye-Scherrer lines. |d Washington, D.C. : National Advisory Committee for Aeronautics, 1951 |w (OCoLC)937438176. |
| 830 | 0 | |a Technical note (United States. National Advisory Committee for Aeronautics) ; |v 2355. |0 http://id.loc.gov/authorities/names/no2009017392. | |
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