Achromatization of Debye-Scherrer lines / Hans Ekstein and Stanley Siegel.

A method is presented for reducing the width of a Debye-Scherrer line produced by diffraction from a polycrystalline medium when the width is due to spectral impurity of the primary characteristic radiation. By this method, different wave lengths diffracted by the sample can be brought to a narrow f...

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Main Author: Ekstein, Hans
Corporate Author: United States. National Advisory Committee for Aeronautics
Other Authors: Siegel, Stanley
Other title:Technical report archive and image library.
Format: Government Document Book
Language:English
Published: Washington, D.C. : National Advisory Committee for Aeronautics, 1951.
Series:Technical note (United States. National Advisory Committee for Aeronautics) ; 2355.
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Call Number: Y 3.N 21/5:6/2355
Y 3.N 21/5:6/2355 Available Place a Hold