Multiple-film back-reflection camera for atomic strain studies / Anthony B. Marmo.
A multiple-film back-reflection camera was designed and a new technique devised to allow more accurate x-ray diffraction analysis of diffuse as well as sharp diffraction patterns. Necessity of measuring film-to-specimen distance was eliminated and other limitations of conventional back-reflection me...
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| Format: | Government Document Book |
| Language: | English |
| Published: |
Washington, D.C. :
National Advisory Committee for Aeronautics,
1950.
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| Series: | Technical note (United States. National Advisory Committee for Aeronautics) ;
2224. |
| Subjects: |
PASCAL Offsite
| Call Number: |
Y 3.N 21/5:6/2224
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| Y 3.N 21/5:6/2224 | Available Place a Hold |