Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy / Bert Voigtländer.

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

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Bibliographic Details
Online Access: Full Text (via Springer)
Main Author: Voigtländer, Bert (Author)
Format: eBook
Language:English
Published: Heidelberg : Springer, [2015]
Series:Nanoscience and technology.
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Call Number: QH212.S33 V65 2015eb
QH212.S33 V65 2015eb Available