Plasma processing of semiconductors / edited by P.F. Williams.
Plasma Processing of Semiconductors contains 28 contributions from 18 experts and covers plasma etching, plasma deposition, plasma-surface interactions, numerical modelling, plasma diagnostics, less conventional processing applications of plasmas, and industrial applications. Audience: Coverage rang...
Saved in:
Online Access: |
Full Text (via Springer) |
---|---|
Corporate Authors: | , |
Other Authors: | |
Format: | Conference Proceeding eBook |
Language: | English |
Published: |
Dordrecht ; Boston :
Kluwer Academic Publishers,
[1997]
|
Series: | NATO ASI series. Applied sciences ;
no. 336. |
Subjects: |
Table of Contents:
- Introduction to plasma etching / T.D. Mantei
- Plasma chemistry, basic processes and PECVD / D.L. Flamm
- The role of ions in reactive ion etchng with low density plasmas / J.W. Coburn
- SiO2 etching in high-density plasmas: differences with low-density plasmas / G.S. Oehrlein
- Introduction to plasma enhanced chemical vapor deposition / T.S. Cale [and others]
- Topography evolution during semiconductor processing / T.S. Cale [and others]
- Deposition of amorphous silicon / J. Perrin
- High density sources for plasma etching / T.D. Montei
- Resonant plasma excitation by electron cyclotron waves--fundamentals and applications / H. Oechsner
- The transition from capacitive to inductive to wave sustained discharges / R.W. Boswell [and others]
- Physics of surface-wave discharges / J. Margot and M. Moisan
- Surface science aspects of etching and wall reactions in high density plasmas / J.W. Coburn
- Plasma-surface interactions / R. d'Agostino
- Cl2 plasma-Si surface interactions plasma etching / V.M. Donnelly [and others]
- Particle in cell Monte Carlo collision codes (PIC-MCC); methods and applications to plasma processing / C.K. Birdsall
- Fluid and hybrid models of non equilibrium discharges / J.P. Boeuf and A. Merad
- Optical diagnostics of processing plasmas / P.F. Williams
- Optical diagnostics of plasmas: a tool for process control / N. Sadeghi, J. Derouard, and J.P. Booth
- Infrared absorption spectroscopy as a diagnostic for processing plasmas / G.M.W. Kroesen
- Ellipsometric analysis of plasma deposited and plasma etched materials / J.A. Woollam
- Mass spectrometry of reactive plasmas / J. Perrin
- Deposition of silicon dioxide films using the helicon diffusion reactor for integrated optics applications / R.W. Boswell . [and others]
- Remote plasma processing / G.S. Oehrlein
- Magnetized surface-wave discharges for submicrometer pattern transfer / J. Margot [and others]
- Dusty plasmas: fundamental aspects and industrial applications / G.M.W. Kroesen
- Low energy plasma beams for semiconductor technology / H. Oechsner
- Process control concepts / S. Watts Butler
- Issues and solutions for applying process control to semiconductor manufacturing / S. Watts Butler.