Benefiting from thermal and mechanical simulation in micro-electronics / edited by G.Q. Zhang, Philips CFT, Eindhoven, the Netherlands, L.J. Ernst, Delft University of Technology, Delft, the Netherlands, O. de Saint Leger, COMPETE Network co-ordinator at MTA, Paris, France.

Benefiting from Thermal and Mechanical Simulation in Micro-Electronics presents papers from the first international conference on this topic, EuroSimE2000. For the first time, people from the electronics industry, research institutes, software companies and universities joined together to discuss pr...

Full description

Saved in:
Bibliographic Details
Online Access: Full Text (via Springer)
Corporate Author: EuroSimE Eindhoven, Netherlands
Other Authors: Zhang, G. Q. (Editor), Ernst, L. J. (Editor), Saint Leger, O. de (Editor)
Format: Conference Proceeding eBook
Language:English
Published: Dordrecht : Springer Science+Business Media, [2000]
Subjects:

Internet

Full Text (via Springer)

Online

Holdings details from Online
Call Number: TK7874 .E97 2000
TK7874 .E97 2000 Available