Quantitative X-Ray Diffractometry / by Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik.
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the st...
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| Format: | eBook |
| Language: | English |
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New York, NY :
Springer US,
1995.
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QD901-999
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| QD901-999 | Available |