Semiconductor Device Reliability / edited by A. Christou, B.A. Unger.

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Bibliographic Details
Online Access:	Full Text (via Springer)
Main Author:	Christou, A.
Other Authors:	Unger, B. A.
Other title:	Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989.
Format:	eBook
Language:	English
Published:	Dordrecht : Springer Netherlands, 1989.
Series:	NATO ASI series. Applied sciences ; 175.
Subjects:	Engineering. System safety. Computer engineering.

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Full Text (via Springer)

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Call Number:	TK1-9971
TK1-9971	Available