X-Ray Spectrometry in Electron Beam Instruments / edited by David B. Williams, Joseph I. Goldstein, Dale E. Newbury.

This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.

Saved in:

Bibliographic Details
Online Access:	Full Text (via Springer)
Main Author:	Williams, David B.
Other Authors:	Goldstein, Joseph I., Newbury, Dale E.
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US : Imprint : Springer, 1995.
Subjects:	Electron beams > Instruments. X-ray spectroscopy. Electron probe microanalysis.

Internet

Full Text (via Springer)

Holdings details from Online
Call Number:	QC793.5.E622
QC793.5.E622	Available