Scanning Electron Microscopy and X-ray Microanalysis / by Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael.
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspe...
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Full Text (via Springer) |
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| Main Author: | |
| Other Authors: | , , , , , , |
| Format: | eBook |
| Language: | English |
| Published: |
Boston, MA :
Springer US,
2003.
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| Edition: | Third edition. |
| Subjects: |
Internet
Full Text (via Springer)Online
| Call Number: |
TA404.6
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| TA404.6 | Available |