X-ray nanoimaging, instruments and methods : 28-29 August 2013, San Diego, California, United States / Barry Lai, editor ; sponsored and published by SPIE.
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Corporate Authors: | , |
Other Authors: | |
Format: | Conference Proceeding eBook |
Language: | English |
Published: |
Bellingham, Washington :
SPIE,
[2013]
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Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 8851. |
Subjects: |
Internet
Full Text (via SPIE Digital Library)Online
Call Number: |
T174.7
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T174.7 | Available |