X-ray nanoimaging, instruments and methods : 28-29 August 2013, San Diego, California, United States / Barry Lai, editor ; sponsored and published by SPIE.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	X-Ray Nanoimaging: Instruments and Methods (Conference) San Diego, Calif.), SPIE (Society) (sponsoring body.)
Other Authors:	Lai, Barry (Editor)
Format:	Conference Proceeding eBook
Language:	English
Published:	Bellingham, Washington : SPIE, [2013]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 8851.
Subjects:	Nanotechnology > Instruments > Congresses. X-ray microscopy > Instruments > Congresses. X-ray optics > Instruments > Congresses. Imaging systems > Instruments > Congresses.

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Call Number:	T174.7
T174.7	Available