VLSI design and test [electronic resource] : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, revised selected papers / Manoj Singh Gaur [and others] (eds.)
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI c...
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| Online Access: |
Full Text (via Springer) |
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| Corporate Author: | |
| Other Authors: | |
| Other title: | VDAT 2013. |
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Heidelberg :
Springer,
©2013.
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| Series: | Communications in computer and information science ;
382. |
| Subjects: |
| Summary: | This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology. |
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| Physical Description: | 1 online resource (xvi, 388 pages) : illustrations. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9783642420245 3642420249 3642420230 9783642420238 |
| ISSN: | 1865-0929 ; |