VLSI design and test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, revised selected papers /

VLSI design and test [electronic resource] : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, revised selected papers / Manoj Singh Gaur [and others] (eds.)

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI c...

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Bibliographic Details
Online Access: Full Text (via Springer)
Corporate Author: VDAT (Symposium) Jaipur, India)
Other Authors: Gaur, Manoj Singh (Editor)
Other title:VDAT 2013.
Format: Electronic Conference Proceeding eBook
Language:English
Published: Heidelberg : Springer, ©2013.
Series:Communications in computer and information science ; 382.
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Computer science.
Integrated circuits > Very large scale integration > Design and construction.
Conference papers and proceedings.

Internet

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Call Number: QA75.5-76.95
QA75.5-76.95 Available

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