Ellipsometry of functional organic surfaces and films / Karsten Hinrichs, Klaus-Jochen Eichhorn, editors.
Ellipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces...
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| Online Access: |
Full Text (via Springer) |
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Heidelberg :
Springer,
2014.
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| Series: | Springer series in surface sciences.
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| Subjects: |
Internet
Full Text (via Springer)Online
| Call Number: |
TA418.9 .T45
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| TA418.9 .T45 | Available |