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| LEADER |
00000cam a2200000xa 4500 |
| 001 |
b7270534 |
| 003 |
CoU |
| 006 |
m o d |
| 007 |
cr ||||||||||| |
| 008 |
120908s1990 waua ob 101 0 eng d |
| 005 |
20230925215952.8 |
| 010 |
|
|
|a 89043272
|
| 019 |
|
|
|a 971072815
|
| 020 |
|
|
|z 0819401986
|
| 020 |
|
|
|z 9780819401984
|
| 035 |
|
|
|a (OCoLC)spie809933916
|
| 035 |
|
|
|a (OCoLC)809933916
|z (OCoLC)971072815
|
| 035 |
|
|
|a (OCoLC)809933916
|
| 040 |
|
|
|a COO
|b eng
|c COO
|d SPIED
|d OCLCA
|d OCLCF
|d OCLCO
|d OCL
|d OCLCO
|d OCLCQ
|d VT2
|
| 049 |
|
|
|a GWRE
|
| 050 |
|
4 |
|a TS510
|b .P632 v. 1162
|
| 245 |
0 |
0 |
|a Laser interferometry, quantitative analysis of interferograms
|h [electronic resource] :
|b third in a series : 7-9 August 1989, San Diego, California /
|c Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University [and others]
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| 260 |
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|a Bellingham, Wash., USA :
|b SPIE,
|c ©1990.
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| 300 |
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|a 1 online resource (ix, 468 pages) :
|b illustrations.
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| 336 |
|
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|a text
|b txt
|2 rdacontent.
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| 337 |
|
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|a computer
|b c
|2 rdamedia.
|
| 338 |
|
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|a online resource
|b cr
|2 rdacarrier.
|
| 490 |
1 |
|
|a Proceedings / SPIE--the International Society for Optical Engineering ;
|v v. 1162.
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| 500 |
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|a "Part of a four-conference program o n Interferometry, Microscopy, and Testing held at SPIE's 33rd Annual International Symposium on Optical & Optoelectronic Applied Science & Engineering, 6-11-August 1989, in San Diego, California"--Page vii.
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| 504 |
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|a Includes bibliographical references and index.
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| 588 |
0 |
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|a Print version record.
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| 650 |
|
0 |
|a Lasers
|x Industrial applications
|v Congresses.
|0 http://id.loc.gov/authorities/subjects/sh2008106672.
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| 650 |
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0 |
|a Laser interferometers
|x Industrial applications
|v Congresses.
|
| 650 |
|
7 |
|a Laser interferometers
|x Industrial applications.
|2 fast
|0 (OCoLC)fst00992811.
|
| 650 |
|
7 |
|a Lasers
|x Industrial applications.
|2 fast
|0 (OCoLC)fst00992853.
|
| 655 |
|
7 |
|a Conference papers and proceedings.
|2 fast
|0 (OCoLC)fst01423772.
|
| 700 |
1 |
|
|a Pryputniewicz, Ryszard J.
|0 http://id.loc.gov/authorities/names/n88082762
|1 http://isni.org/isni/0000000063755970.
|
| 710 |
2 |
|
|a Society of Photo-Optical Instrumentation Engineers.
|0 http://id.loc.gov/authorities/names/n78088934
|1 http://isni.org/isni/0000000122965856.
|
| 710 |
2 |
|
|a New Mexico State University.
|b Applied Optics Laboratory.
|0 http://id.loc.gov/authorities/names/n87905402
|1 http://isni.org/isni/0000000122224927.
|
| 711 |
2 |
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|a International Symposium on Optical and Optoelectronic Applied Sciences and Engineering
|n (33rd :
|d 1989 :
|c San Diego, Calif.)
|
| 776 |
0 |
8 |
|i Print version:
|t Laser interferometry, quantitative analysis of interferograms.
|d Bellingham, Wash., USA : SPIE, ©1990
|z 0819401986
|w (DLC) 89043272
|w (OCoLC)24374318.
|
| 856 |
4 |
0 |
|u https://colorado.idm.oclc.org/login?url=http://proceedings.spiedigitallibrary.org/volume.aspx?volume=1162
|z Full Text (via SPIE Digital Library)
|
| 830 |
|
0 |
|a Proceedings of SPIE--the International Society for Optical Engineering ;
|v v. 1162.
|0 http://id.loc.gov/authorities/names/n42030541.
|
| 907 |
|
|
|a .b72705346
|b 03-19-20
|c 01-23-13
|
| 915 |
|
|
|a I
|
| 998 |
|
|
|a web
|b 05-02-17
|c g
|d b
|e -
|f eng
|g wau
|h 0
|i 1
|
| 907 |
|
|
|a .b72705346
|b 07-26-19
|c 01-23-13
|
| 944 |
|
|
|a MARS - RDA ENRICHED
|
| 907 |
|
|
|a .b72705346
|b 07-06-17
|c 01-23-13
|
| 907 |
|
|
|a .b72705346
|b 05-23-17
|c 01-23-13
|
| 956 |
|
|
|a SPIE Digital Library
|
| 956 |
|
|
|b SPIE Digital Library
|
| 999 |
f |
f |
|i 238f6d04-6924-5303-8a38-b7258c28e36e
|s 67a463d5-a424-5f72-8ec9-646df6223187
|
| 952 |
f |
f |
|p Can circulate
|a University of Colorado Boulder
|b Online
|c Online
|d Online
|e TS510 .P632 v. 1162
|h Library of Congress classification
|i web
|n 1
|
