Laser interferometry, quantitative analysis of interferograms [electronic resource] : third in a series : 7-9 August 1989, San Diego, California / Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University [and others]

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Society of Photo-Optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory, International Symposium on Optical and Optoelectronic Applied Sciences and Engineering
Other Authors:	Pryputniewicz, Ryszard J.
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	Bellingham, Wash., USA : SPIE, ©1990.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1162.
Subjects:	Lasers > Industrial applications > Congresses. Laser interferometers > Industrial applications > Congresses. Laser interferometers > Industrial applications. Lasers > Industrial applications. Conference papers and proceedings.

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Call Number:	TS510 .P632 v. 1162
TS510 .P632 v. 1162	Available