Laser interferometry, quantitative analysis of interferograms [electronic resource] : third in a series : 7-9 August 1989, San Diego, California / Ryszard J. Pryputniewicz, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University [and others]
Saved in:
| Online Access: |
Full Text (via SPIE Digital Library) |
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| Corporate Authors: | , , |
| Other Authors: | |
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
©1990.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1162. |
| Subjects: |
| Item Description: | "Part of a four-conference program o n Interferometry, Microscopy, and Testing held at SPIE's 33rd Annual International Symposium on Optical & Optoelectronic Applied Science & Engineering, 6-11-August 1989, in San Diego, California"--Page vii. |
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| Physical Description: | 1 online resource (ix, 468 pages) : illustrations. |
| Bibliography: | Includes bibliographical references and index. |