Automated inspection and measurement [electronic resource] : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
Saved in:
| Online Access: |
Full Text (via SPIE Digital Library) |
|---|---|
| Corporate Author: | |
| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
©1987.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 730. |
| Subjects: |
Search Result 1