Automated inspection and measurement [electronic resource] : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Author:	Society of Photo-Optical Instrumentation Engineers
Other Authors:	Chen, Michael J. W., Thibadeau, Robert
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1987.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 730.
Subjects:	Engineering inspection > Automation > Congresses. Quality control > Optical methods > Congresses. Engineering inspection > Automation. Quality control > Optical methods. Conference papers and proceedings.

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Holdings details from Online
Call Number:	TS156.2 .A89 1987
TS156.2 .A89 1987	Available