Atomic-Resolution STEM at Low Primary Energies

Atomic-Resolution STEM at Low Primary Energies [electronic resource]

Aberration-corrected scanning transmission electron microscopes (STEMs) can now produce electron probes as small as 1 Å at 60 keV. This level of performance allows individual light atoms to be imaged in various novel materials including graphene, monolayer boron nitride, and carbon nanotubes. Operat...

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Bibliographic Details
Online Access: Online Access
Corporate Author: Oak Ridge National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. Office of Science ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2011.
Subjects:
Atomic Number.
Atoms.
Boron Nitrides.
Carbon.
Electron Microscopes.
Electrons.
Electron Probes.
Nanotubes.
Energy-Loss Spectroscopy.
Performance.
Radiations.
Knock-On.
Resolution.
Spatial Resolution.
Spectra.
Nanoscience And Nanotechnology.

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Call Number: E 1.99:1011020
E 1.99:1011020 Available

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