Optical constants of magnetron sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV

Optical constants of magnetron sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV [electronic resource]

This work discusses the experimental determination of the optical constants (refractive index) of DC-magnetron-sputtered boron carbide films in the 30-770 eV photon energy range. Transmittance measurements of three boron carbide films with thicknesses of 54.2, 79.0 and 112.5 nm were performed for th...

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Bibliographic Details
Online Access: Online Access
Corporate Author: Lawrence Berkeley National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2008.
Subjects:
Absorption.
Atomic Force Microscopy.
Backscattering.
Boron.
Boron Carbides.
Carbon.
Chemistry.
Energy Range.
Magnetrons.
Morphology.
Oxygen.
Photons.
Refractive Index.
Rutherford Backscattering Spectroscopy.
Scanning Electron Microscopy.
Fine Structure.
Thin Films.
X-Ray Photoelectron Spectroscopy.
Materials Science.
Classical And Quantumm Mechanics, General Physics.

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Call Number: E 1.99:llnl-jrnl-404257
E 1.99:llnl-jrnl-404257 Available

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