Hardness by design technique for field programmable gate arrays.

Hardness by design technique for field programmable gate arrays. [electronic resource]

FPGAs are an attractive alternative for many space-based computing operations. While radiation hardened FPGAs are available, SRAM-based FPGAs are susceptible to Single-Event Upsets (SEUs). Several FPGA design hardening techniques are investigated to improve the reliability of FPGA designs operating...

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Bibliographic Details
Online Access: Online Access
Corporate Author: Los Alamos National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2003.
Subjects:
Design.
Hardening.
Hardness.
Nasa.
Radiations.
Reliability.
Simulation.
Computers.
Radiation Effects.
Mathematical Methods And Computing.

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Call Number: E 1.99:la-ur-03-2848
E 1.99:la-ur-03-2848 Available

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