On the feasibility to investigate point defects by advanced electron microscopy [electronic resource]
Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced ele...
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Online Access |
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| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Dept. of Energy. Office of Basic Energy Sciences ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
2002.
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| Summary: | Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced electron microscopes, it is feasible to promote experiments that aim to detect single atoms. This enables local investigations of non-stoichiometry. This paper reviews the current state-of-the-art. Hrtem Gan Non-stochiometrt. |
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| Item Description: | Published through the Information Bridge: DOE Scientific and Technical Information. 10/02/2002. "lbnl--52150" "B& R KC0201010" 4th Symposium on non-stoichiometric III-V compounds, Asilomar, CA (US), 10/02/2002--10/04/2002. Kisielowski, C.; Jinschek, J.R. |
| Physical Description: | vp. : digital, PDF file. |