On the feasibility to investigate point defects by advanced electron microscopy [electronic resource]
Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced ele...
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Online Access |
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| Format: | Government Document Electronic eBook |
| Language: | English |
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Washington, D.C. : Oak Ridge, Tenn. :
United States. Dept. of Energy. Office of Basic Energy Sciences ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
2002.
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Internet
Online AccessOnline
| Call Number: |
E 1.99:lbnl--52150
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| E 1.99:lbnl--52150 | Available |