Nondestructive Characterization of Atomic Profiles in Layer-Structured Photovoltaic Materials Using the Method of Angular Dependence of X-Ray Fluorescence (ADXRF) [electronic resource]

Angular dependence of x-ray fluorescence technique has been applied to the study of atomic density profile in composite systems. This method is shown to be useful for probing the microstructures and intermixing of constituent elements in layer-structured photovoltaic materials.

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Bibliographic Details
Online Access: Online Access (via OSTI)
Corporate Author: National Renewable Energy Laboratory (U.S.) (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2000.
Subjects:

MARC

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500 |a Program and Proceedings: NCPV Program Review Meeting 2000, 16-19 April 2000, Denver Colorado; NREL/BK-520-28064. 
500 |a Kim, S.; Soo, Y. L.; Kioseoglou, G.; Huang, S.; Kao, Y. H.; Ramanathan, K.; Deb, S. 
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520 0 |a Photovoltaics; Research And Development; Markets; Applications; Components; Systems; Systems Integration; Manufacturing; Crystalline Si; Concentrators; Thin-Films; Cadmium Telluride; Copper Indium Diselenide; Amorphous Si; Ncpv; Solar Energy - Photovoltaics. 
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