Nondestructive Characterization of Atomic Profiles in Layer-Structured Photovoltaic Materials Using the Method of Angular Dependence of X-Ray Fluorescence (ADXRF) [electronic resource]
Angular dependence of x-ray fluorescence technique has been applied to the study of atomic density profile in composite systems. This method is shown to be useful for probing the microstructures and intermixing of constituent elements in layer-structured photovoltaic materials.
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Corporate Author: | |
Format: | Government Document Electronic eBook |
Language: | English |
Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Department of Energy. ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,
2000.
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Subjects: |
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245 | 0 | 0 | |a Nondestructive Characterization of Atomic Profiles in Layer-Structured Photovoltaic Materials Using the Method of Angular Dependence of X-Ray Fluorescence (ADXRF) |h [electronic resource] |
260 | |a Washington, D.C. : |b United States. Department of Energy. ; |a Oak Ridge, Tenn. : |b distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, |c 2000. | ||
300 | |a pp. 157-158 : |b digital, PDF file. | ||
336 | |a text |b txt |2 rdacontent. | ||
337 | |a computer |b c |2 rdamedia. | ||
338 | |a online resource |b cr |2 rdacarrier. | ||
500 | |a Published through SciTech Connect. | ||
500 | |a 01/01/2000. | ||
500 | |a Program and Proceedings: NCPV Program Review Meeting 2000, 16-19 April 2000, Denver Colorado; NREL/BK-520-28064. | ||
500 | |a Kim, S.; Soo, Y. L.; Kioseoglou, G.; Huang, S.; Kao, Y. H.; Ramanathan, K.; Deb, S. | ||
520 | 3 | |a Angular dependence of x-ray fluorescence technique has been applied to the study of atomic density profile in composite systems. This method is shown to be useful for probing the microstructures and intermixing of constituent elements in layer-structured photovoltaic materials. | |
520 | 0 | |a Photovoltaics; Research And Development; Markets; Applications; Components; Systems; Systems Integration; Manufacturing; Crystalline Si; Concentrators; Thin-Films; Cadmium Telluride; Copper Indium Diselenide; Amorphous Si; Ncpv; Solar Energy - Photovoltaics. | |
536 | |b AC36-99-GO10337. | ||
650 | 7 | |a Fluorescence. |2 local. | |
650 | 7 | |a Solar Energy. |2 local. | |
650 | 7 | |a Materials. |2 local. | |
650 | 7 | |a Solar Energy. |2 edbsc. | |
650 | 7 | |a Materials Science. |2 edbsc. | |
710 | 2 | |a National Renewable Energy Laboratory (U.S.). |4 res. | |
710 | 1 | |a United States. |b Department of Energy. |4 spn. | |
710 | 1 | |a United States. |b Department of Energy. |b Office of Scientific and Technical Information. |4 dst. | |
856 | 4 | 0 | |u http://www.osti.gov/scitech/biblio/909446 |z Online Access (via OSTI) |
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952 | f | f | |p Can circulate |a University of Colorado Boulder |b Online |c Online |d Online |e E 1.99:909446 |h Superintendent of Documents classification |i web |n 1 |