Nondestructive Characterization of Atomic Profiles in Layer-Structured Photovoltaic Materials Using the Method of Angular Dependence of X-Ray Fluorescence (ADXRF) [electronic resource]
Angular dependence of x-ray fluorescence technique has been applied to the study of atomic density profile in composite systems. This method is shown to be useful for probing the microstructures and intermixing of constituent elements in layer-structured photovoltaic materials.
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| Online Access: |
Online Access (via OSTI) |
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| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Department of Energy. ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,
2000.
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| Subjects: |
Internet
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| Call Number: |
E 1.99:909446
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| E 1.99:909446 | Available |