Novel Approaches to Surface Analysis and Materials Engineering Using Highly Charged Ions [electronic resource]
Complex problems in materials science require very sensitive, high spatial resolution (< 100 nm) determination of chemical (molecular) structures in near-surface volumes. Slow, highly charged ions (HCIs) provide a new, unique tool for probing chemical structure on a nanometer scale. The authors h...
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Format: | Government Document Electronic eBook |
Language: | English |
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Washington, D.C : Oak Ridge, Tenn. :
United States. Department of Energy. Office of the Assistant Secretary for Defense Programs ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,
2000.
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Internet
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E 1.99:ucrl-id-137449
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E 1.99:ucrl-id-137449 | Available |