Microbeam Studies of Diffusion Time Resolved Ion Beam Induced Charge Collection from Stripe-Like Junctions

Microbeam Studies of Diffusion Time Resolved Ion Beam Induced Charge Collection from Stripe-Like Junctions [electronic resource]

To design more radiation tolerant Integrated Circuits (ICs), it is essential to create and test accurate models of ionizing radiation induced charge collection dynamics within microcircuits. A new technique, Diffusion Time Resolved Ion Beam Induced Charge Collection (DTRIBICC), is proposed to measur...

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Bibliographic Details
Online Access: Online Access
Corporate Author: Sandia National Laboratories (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C : Oak Ridge, Tenn. : United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 2000.
Subjects:
Mitigation.
Radiation Effects.
Ionizing Radiations.
Diffusion.
Charge Collection.
Integrated Circuits.
Semiconductor Junctions.
Ion Beams.
Measuring Methods.
Engineering.
Instrumentation Related To Nuclear Science And Technology.

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Call Number: E 1.99:sand2000-1511j
E 1.99:sand2000-1511j Available

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