Small area analysis using micro-diffraction techniques

Small area analysis using micro-diffraction techniques [electronic resource]

An overall trend toward smaller electronic packages and devices makes it increasingly important and difficult to obtain meaningful diffraction information from small areas. X-ray micro-diffraction, electron back-scattered diffraction (EBSD) and Kossel are micro-diffraction techniques used for crysta...

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Bibliographic Details
Online Access: Online Access
Corporate Author: Sandia National Laboratories (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C : Oak Ridge, Tenn. : United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 2000.
Subjects:
Miniaturization.
X-ray Diffraction.
Nondestructive Analysis.
Crystal Structure.
Semiconductor Devices.
Crystallography.
Residual Stresses.
X Radiation.
Microstructure.
Scanning Electron Microscopy.
Optical Systems.
Engineering.
Condensed Matter Physics, Superconductivity And Superfluidity.

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Call Number: E 1.99:sand2000-0407c
E 1.99:sand2000-0407c Available

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