Design, manufacturing, and testing of micro-and nano-optical devices and systems [electronic resource] : 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China / Tianchun Ye [and others], editors.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	International Symposium on Advanced Optical Manufacturing and Testing Technologies, Zhongguo guang xue xue hui, SPIE (Society), Zhongguo ke xue yuan. Guang dian ji shu yan jiu suo, China. Guo jia ke xue ji shu bu, Zhongguo ke xue yuan, Guo jia zi ran ke xue ji jin wei yuan hui (China)
Other Authors:	Ye, Tianchun
Other title:	5th International Symposium on Advanced Optical Manufacturing and Testing Technologies. Fifth International Symposium on Advanced Optical Manufacturing and Testing Technologies. International Symposium on Advanced Optical Manufacturing and Testing Technologies.
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	Bellingham, WA : SPIE, ©2010.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 7657.
Subjects:	Optical instruments > Design and construction > Congresses. Optical instruments > Testing > Congresses. Optoelectronic devices > Design and construction > Congresses. Optoelectronic devices > Testing > Congresses. Optical instruments > Design and construction. Optical instruments > Testing. Optoelectronic devices > Design and construction. Optoelectronic devices > Testing. Conference papers and proceedings.

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Call Number:	QC372.2.D4
QC372.2.D4	Available