Optical test and measurement technology and equipment [electronic resource] : 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China / Yudong Zhang [and others], editors ; sponsored by COS--the Chinese Optical Society (China), IOE--the Institute of Optics and Electronics, CAS (China) ; cosponsored by SPIE ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), National Natural Science Foundation of China (China) ; cooperating organizations, Fraunhofer Institute for Applied Optics and Precision Engineering [and others]
Saved in:
| Online Access: |
Full Text (via SPIE Digital Library) |
|---|---|
| Corporate Authors: | , , , , , , |
| Other Authors: | |
| Other title: | 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies. Fifth International Symposium on Advanced Optical Manufacturing and Testing Technologies. International Symposium on Advanced Optical Manufacturing and Testing Technologies. |
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Bellingham, WA :
SPIE,
©2010.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 7656. |
| Subjects: |
MARC
| LEADER | 00000cam a2200000xa 4500 | ||
|---|---|---|---|
| 001 | b6732261 | ||
| 003 | CoU | ||
| 005 | 20170428043017.9 | ||
| 006 | m o d | ||
| 007 | cr ||||||||||| | ||
| 008 | 110420s2010 waua ob 101 0 eng d | ||
| 020 | |z 9780819480866 | ||
| 020 | |z 081948086X | ||
| 035 | |a (OCoLC)spie713684194 | ||
| 035 | |a (OCoLC)713684194 | ||
| 040 | |a WAU |b eng |c WAU |d SPIED |d OCLCQ |d OCLCF |d OCLCA |d OCL |d OCLCO |d OCLCQ |d VT2 | ||
| 049 | |a GWRE | ||
| 050 | 1 | 4 | |a QC374 |
| 111 | 2 | |a International Symposium on Advanced Optical Manufacturing and Testing Technologies |n (5th : |d 2010) | |
| 245 | 1 | 0 | |a Optical test and measurement technology and equipment |h [electronic resource] : |b 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China / |c Yudong Zhang [and others], editors ; sponsored by COS--the Chinese Optical Society (China), IOE--the Institute of Optics and Electronics, CAS (China) ; cosponsored by SPIE ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), National Natural Science Foundation of China (China) ; cooperating organizations, Fraunhofer Institute for Applied Optics and Precision Engineering [and others] |
| 246 | 3 | 0 | |a 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies. |
| 246 | 3 | |a Fifth International Symposium on Advanced Optical Manufacturing and Testing Technologies. | |
| 246 | 3 | 0 | |a International Symposium on Advanced Optical Manufacturing and Testing Technologies. |
| 260 | |a Bellingham, WA : |b SPIE, |c ©2010. | ||
| 300 | |a 1 online resource (3 volumes) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a computer |b c |2 rdamedia. | ||
| 338 | |a online resource |b cr |2 rdacarrier. | ||
| 490 | 1 | |a Proceedings of SPIE, |x 0277-786X ; |v v. 7656. | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Optical materials |x Testing |v Congresses. | |
| 650 | 0 | |a Optical measurements |v Congresses. |0 http://id.loc.gov/authorities/subjects/sh2008108676. | |
| 650 | 0 | |a Measurement |v Congresses. |0 http://id.loc.gov/authorities/subjects/sh2008107149. | |
| 650 | 7 | |a Measurement. |2 fast |0 (OCoLC)fst01715944. | |
| 650 | 7 | |a Optical materials |x Testing. |2 fast |0 (OCoLC)fst01046775. | |
| 650 | 7 | |a Optical measurements. |2 fast |0 (OCoLC)fst01046776. | |
| 655 | 7 | |a Conference papers and proceedings. |2 fast |0 (OCoLC)fst01423772. | |
| 700 | 1 | |a Zhang, Yudong. |0 http://id.loc.gov/authorities/names/no2006103918 |1 http://isni.org/isni/0000000048689530. | |
| 710 | 2 | |a Zhongguo guang xue xue hui. |0 http://id.loc.gov/authorities/names/n82154464. | |
| 710 | 2 | |a Zhongguo ke xue yuan. |b Guang dian ji shu yan jiu suo. |0 http://id.loc.gov/authorities/names/no2010136656. | |
| 710 | 2 | |a SPIE (Society) |0 http://id.loc.gov/authorities/names/no2007109252. | |
| 710 | 2 | |a Guo jia zi ran ke xue ji jin wei yuan hui (China) |0 http://id.loc.gov/authorities/names/no92021570 |1 http://isni.org/isni/000000012107957X. | |
| 710 | 1 | |a China. |b Guo jia ke xue ji shu bu. |0 http://id.loc.gov/authorities/names/nr99034085 |1 http://isni.org/isni/0000000121057338. | |
| 710 | 2 | |a Zhongguo ke xue yuan. |0 http://id.loc.gov/authorities/names/n50072256 |1 http://isni.org/isni/0000000119573309. | |
| 776 | 0 | 8 | |i Print version: |a International Symposium on Advanced Optical Manufacturing and Testing Technologies (5th : 2010 : Dalian Shi, China). |t Optical test and measurement technology and equipment. |d Bellingham, WA : SPIE, ©2010 |z 9780819480866 |w (OCoLC)706116487. |
| 830 | 0 | |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v. 7656. |0 http://id.loc.gov/authorities/names/n42030541. | |
| 856 | 4 | 0 | |u https://colorado.idm.oclc.org/login?url=http://proceedings.spiedigitallibrary.org/volume.aspx?volume=7656 |z Full Text (via SPIE Digital Library) |
| 907 | |a .b6732261x |b 03-20-20 |c 09-20-11 | ||
| 998 | |a web |b 07-01-17 |c g |d b |e - |f eng |g wau |h 0 |i 1 | ||
| 907 | |a .b6732261x |b 07-26-19 |c 09-20-11 | ||
| 944 | |a MARS - RDA ENRICHED | ||
| 907 | |a .b6732261x |b 01-17-18 |c 09-20-11 | ||
| 907 | |a .b6732261x |b 07-06-17 |c 09-20-11 | ||
| 907 | |a .b6732261x |b 05-23-17 |c 09-20-11 | ||
| 915 | |a I | ||
| 956 | |a SPIE Digital Library | ||
| 956 | |b SPIE Digital Library | ||
| 999 | f | f | |i 6b09315a-23db-5e4e-b95a-7cf124fad824 |s c792a75b-be80-5c19-852a-5ab8eb0ec1d3 |
| 952 | f | f | |p Can circulate |a University of Colorado Boulder |b Online |c Online |d Online |e QC374 |h Library of Congress classification |i web |n 1 |