Optical test and measurement technology and equipment [electronic resource] : 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China / Yudong Zhang [and others], editors ; sponsored by COS--the Chinese Optical Society (China), IOE--the Institute of Optics and Electronics, CAS (China) ; cosponsored by SPIE ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), National Natural Science Foundation of China (China) ; cooperating organizations, Fraunhofer Institute for Applied Optics and Precision Engineering [and others]

Saved in:
Bibliographic Details
Online Access: Full Text (via SPIE Digital Library)
Corporate Authors: International Symposium on Advanced Optical Manufacturing and Testing Technologies, Zhongguo guang xue xue hui, Zhongguo ke xue yuan. Guang dian ji shu yan jiu suo, SPIE (Society), Guo jia zi ran ke xue ji jin wei yuan hui (China), China. Guo jia ke xue ji shu bu, Zhongguo ke xue yuan
Other Authors: Zhang, Yudong
Other title:5th International Symposium on Advanced Optical Manufacturing and Testing Technologies.
Fifth International Symposium on Advanced Optical Manufacturing and Testing Technologies.
International Symposium on Advanced Optical Manufacturing and Testing Technologies.
Format: Electronic Conference Proceeding eBook
Language:English
Published: Bellingham, WA : SPIE, ©2010.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 7656.
Subjects:

Internet

Full Text (via SPIE Digital Library)

Online

Holdings details from Online
Call Number: QC374
QC374 Available