Scanning microscopy 2010 [electronic resource] : 17-19 May 2010, Monterey, California, United States / Michael T. Postek [and others], editors ; sponsored by SPIE ; technical cosponsor, NIST--National Institute of Standards and Technology (United States)

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Author:	SPIE (Society)
Other Authors:	Postek, Michael T.
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Wash. : SPIE, ©2010.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 7729.
Subjects:	Scanning electron microscopes > Congresses. Scanning electron microscopes. Conference papers and proceedings.

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Call Number:	QH212.S3 .S346 2010e
QH212.S3 .S346 2010e	Available