Exploring the Relationship between Item Exposure Rate and Test Overlap Rate in Computerized Adaptive Testing [electronic resource] / Shu-Ying Chen, Robert D. Ankenmann and Judith A. Spray.
This paper presents a derivation of an average between-test overlap index as a function of the item exposure index, for fixed-length computerized adaptive tests (CAT). This relationship is used to investigate the simultaneous control of item exposure at both the item and test levels. Implications fo...
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| Format: | Electronic eBook |
| Language: | English |
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[S.l.] :
Distributed by ERIC Clearinghouse,
1999.
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Internet
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ED435643
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| ED435643 | Available |