Use of Three-Parameter Item Response Theory in the Development of CTBS, Form U, and TCS

Use of Three-Parameter Item Response Theory in the Development of CTBS, Form U, and TCS [microform] / Wendy M. Yen.

The three-parameter logistic model discussed was used by CTB/McGraw-Hill in the development of the Comprehensive Tests of Basic Skills, Form U (CTBS/U) and the Test of Cognitive Skills (TCS), published in the fall of 1981. The development, standardization, and scoring of the tests are described, par...

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Main Author: Yen, Wendy M.
Format: Microfilm Book
Language:English
Published: [S.l.] : Distributed by ERIC Clearinghouse, 1982.
Subjects:
Achievement Tests.
Bayesian Statistics.
Cognitive Processes.
Data Collection.
Item Analysis.
Latent Trait Theory.
Maximum Likelihood Statistics.
Scoring.
Standardized Tests.
Test Construction.
Test Items.

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