Microanalysis by electron energy loss spectroscopy at 300kV [electronic resource]
Some features of the anticipated improvements in microanalysis by electron energy loss spectroscopy (EELS) at 300 kV compared to opeation at 100kV have been studied with the use of a Philips EM430T equipped with Gatan 607 EELS and EDAX 9100/70 systems. Detailed measurements have been made on a range...
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Online Access |
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| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Oak Ridge, Tenn. : Oak Ridge, Tenn. :
Oak Ridge National Laboratory. ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
1986.
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| Subjects: |
MARC
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| 245 | 0 | 0 | |a Microanalysis by electron energy loss spectroscopy at 300kV |h [electronic resource] |
| 260 | |a Oak Ridge, Tenn. : |b Oak Ridge National Laboratory. ; |a Oak Ridge, Tenn. : |b distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, |c 1986. | ||
| 300 | |a Pages: 3 : |b digital, PDF file. | ||
| 336 | |a text |b txt |2 rdacontent. | ||
| 337 | |a computer |b c |2 rdamedia. | ||
| 338 | |a online resource |b cr |2 rdacarrier. | ||
| 500 | |a Published through the Information Bridge: DOE Scientific and Technical Information. | ||
| 500 | |a 01/01/1986. | ||
| 500 | |a "conf-860854-2" | ||
| 500 | |a "DE86009306" | ||
| 500 | |a 11. international congress on electron microscopy, Kyoto, Japan, 31 Aug 1986. | ||
| 500 | |a Bentley, J.; Angelini, P. | ||
| 520 | 3 | |a Some features of the anticipated improvements in microanalysis by electron energy loss spectroscopy (EELS) at 300 kV compared to opeation at 100kV have been studied with the use of a Philips EM430T equipped with Gatan 607 EELS and EDAX 9100/70 systems. Detailed measurements have been made on a range of specimens, with emphasis on boron nitride and silicon carbide. | |
| 536 | |b AC05-84OR21400. | ||
| 650 | 7 | |a Electron Spectroscopy. |2 local. | |
| 650 | 7 | |a Spectroscopy. |2 local. | |
| 650 | 7 | |a Pnictides. |2 local. | |
| 650 | 7 | |a Microanalysis. |2 local. | |
| 650 | 7 | |a Carbides. |2 local. | |
| 650 | 7 | |a Boron Compounds. |2 local. | |
| 650 | 7 | |a Silicon Compounds. |2 local. | |
| 650 | 7 | |a Carbon Compounds. |2 local. | |
| 650 | 7 | |a Nitrogen Compounds. |2 local. | |
| 650 | 7 | |a Boron Nitrides. |2 local. | |
| 650 | 7 | |a Silicon Carbides. |2 local. | |
| 650 | 7 | |a Nitrides. |2 local. | |
| 650 | 7 | |a Energy-loss Spectroscopy. |2 local. | |
| 650 | 7 | |a Materials Science. |2 edbsc. | |
| 710 | 2 | |a Oak Ridge National Laboratory. |4 res. | |
| 710 | 1 | |a United States. |b Department of Energy. |b Office of Scientific and Technical Information. |4 dst. | |
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