Microanalysis by electron energy loss spectroscopy at 300kV

Microanalysis by electron energy loss spectroscopy at 300kV [electronic resource]

Some features of the anticipated improvements in microanalysis by electron energy loss spectroscopy (EELS) at 300 kV compared to opeation at 100kV have been studied with the use of a Philips EM430T equipped with Gatan 607 EELS and EDAX 9100/70 systems. Detailed measurements have been made on a range...

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Bibliographic Details
Online Access: Online Access
Corporate Author: Oak Ridge National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Oak Ridge, Tenn. : Oak Ridge, Tenn. : Oak Ridge National Laboratory. ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1986.
Subjects:
Electron Spectroscopy.
Spectroscopy.
Pnictides.
Microanalysis.
Carbides.
Boron Compounds.
Silicon Compounds.
Carbon Compounds.
Nitrogen Compounds.
Boron Nitrides.
Silicon Carbides.
Nitrides.
Energy-loss Spectroscopy.
Materials Science.

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Call Number: E 1.99:conf-860854-2
E 1.99:conf-860854-2 Available

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