Grain boundary microstructure and transport critical current density in YBa{sub 2}Cu{sub 3}O{sub x}

Grain boundary microstructure and transport critical current density in YBa{sub 2}Cu{sub 3}O{sub x} [electronic resource]

Show other versions (1)

It is proposed that the transport critical current (J{sub c}) density for high-{Tc} thin films, bicrystals, and bulk ceramics is determined by magnetic field penetration into the grain boundaries; the grain orientation may not in all cases be an important factor. The parameter (λ{sub L}/λ{sub J})² c...

Full description

Saved in:
Bibliographic Details
Online Access: Online Access
Corporate Author: Argonne National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Arlington, Va. : Oak Ridge, Tenn. : National Science Foundation (U.S.) ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 1991.
Subjects:
High-Tc Superconductors.
Critical Current.
Current Density.
Grain Boundaries.
Copper Oxides.
Superconducting Films.
Barium Oxides.
Yttrium Oxides.
Josephson Junctions.
Transmission Electron Microscopy.
Microstructure.
Materials Science.

Internet

Online Access

Online

Holdings details from Online
Call Number: E 1.99: conf-9109102--3
E 1.99: conf-9109102--3 Available

Similar Items