Toward a surface photoelectron diffractometer [electronic resource] : A progress report on selected advances and an assessment.
X-ray diffractometric determination of atomic structures in ordered bulk systems is highly automated and has wide application. By contrast, surface crystallography, whether based on photon or electron scattering, is still in a relatively early stage of development. A summary is given of recent selec...
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Corporate Authors: | , |
Format: | Government Document Electronic eBook |
Language: | English |
Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
1993.
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Internet
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Call Number: |
E 1.99: conf-930764--2
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E 1.99: conf-930764--2 | Available |