A bipolar integrator for secondary emission profile monitors at the SSCL [electronic resource]
Many invasive techniques for monitoring beam profile and intensity require secondary emission signals in order to make the measurement. Signal acquisition and processing can take many forms. This paper describes a bipolar integration technique which uses the Burr-Brown ACF2101 Dual Switched Integrat...
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Online Access |
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| Corporate Author: | |
| Format: | Government Document Electronic eBook |
| Language: | English |
| Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy,
1994.
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| Subjects: |
Internet
Online AccessOnline
| Call Number: |
E 1.99:sscl--657
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| E 1.99:sscl--657 | Available |