Digital system verification [electronic resource] : a combined formal methods and simulation framework / Lun Li, Mitchell A. Thornton.

Integrated circuit capacity follows Moore's law, and chips are commonly produced at the time of this writing with over 70 million gates per device. Ensuring correct functional behavior of such large designs before fabrication poses an extremely challenging problem. Formal verification validates...

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Online Access: Full Text (via Morgan & Claypool)
Main Author: Li, Lun, 1970-
Other Authors: Thornton, Mitchell Aaron
Other title:Synthesis digital library of engineering and computer science.
Format: Electronic eBook
Language:English
Published: San Rafael, Calif. (1537 Fourth Street, San Rafael, CA 94901 USA) : Morgan & Claypool Publishers, ©2010.
Series:Synthesis lectures on digital circuits and systems (Online) ; # 27.
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Call Number: TK7874.58 .L53 2010
TK7874.58 .L53 2010 Available