A comparison of different texture analysis techniques

A comparison of different texture analysis techniques [electronic resource]

With the advent of automated techniques for measuring individual crystallographic orientations using electron diffraction, there has been an increase in the use of local orientation measurements for measuring textures in polycrystalline materials. Several studies have focused on the number of single...

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Bibliographic Details
Online Access: Online Access
Corporate Author: Los Alamos National Laboratory (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Dept. of Energy ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1996.
Subjects:
Copper.
Texture.
Polycrystals.
Electron Diffraction.
Neutron Diffraction.
X-ray Diffraction.
Grain Size.
Grain Orientation.
Materials Science ;66 Physics.

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Call Number: E 1.99:CONF-9609220--1
E 1.99:CONF-9609220--1 Available

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